The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 25, 2025

Filed:

Dec. 03, 2020
Applicant:

Mitsubishi Electric Corporation, Tokyo, JP;

Inventors:

Yohei Mikami, Tokyo, JP;

Tetsuhiro Fukao, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 1/44 (2006.01); G01R 31/26 (2020.01); H01S 5/00 (2006.01);
U.S. Cl.
CPC ...
G01R 1/44 (2013.01); G01R 31/2601 (2013.01); H01S 5/0014 (2013.01);
Abstract

A semiconductor laser device () is placed on a first heating-cooling device (). A probe holder () is attached on a second heating-cooling device (), A measurement probe () is fixed to a distal end of the probe holder (). A fine movement table () moves the second heating-cooling device () and the probe holder () so that a distal end of the measurement probe () contacts the semiconductor laser device (). An inspection apparatus () inputs an inspection signal to the semiconductor laser device () through the measurement probe ().


Find Patent Forward Citations

Mikami, Yohei. (2025). Semiconductor laser inspection apparatus (U.S. Patent No. 12259408). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12259408

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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