The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 25, 2025

Filed:

Sep. 10, 2021
Applicant:

Waters Technologies Corporation, Milford, MA (US);

Inventors:

Amit Patel, Shrewsbury, MA (US);

Moon Chul Jung, Waltham, MA (US);

Matthew A. Lauber, North Smithfield, RI (US);

Kevin Wyndham, Upton, MA (US);

Mathew H. DeLano, Needham, MA (US);

Jennifer Simeone, Shrewsbury, MA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 30/04 (2006.01); G01N 30/02 (2006.01);
U.S. Cl.
CPC ...
G01N 30/04 (2013.01); G01N 2030/025 (2013.01); G01N 2030/042 (2013.01);
Abstract

The present disclosure is directed to methods of characterizing a system containing a chromatographic column. The methods can include introducing a sample comprising a positive control and a negative control to the system containing a chromatographic column, wherein the positive control is a sensitive probe that interacts with the system and the negative control is substantially non-interacting with the system; after passing the sample through the chromatographic column, detecting the positive control and the negative control; and determining system suitability by comparing the amount of detected positive control to negative control. In some embodiments, determining system suitability (e.g., inertness of sample to the system) is accomplished by determining a ratio of detected positive control to negative control.


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