The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2025
Filed:
Oct. 15, 2021
Riken, Wako, JP;
Kunihiro Fujita, Wako, JP;
Chihiro Iwamoto, Wako, JP;
Takaoki Takanashi, Wako, JP;
Yoshie Otake, Wako, JP;
RIKEN, Wako, JP;
Abstract
A nondestructive inspecting device () includes a neutron emission device () that emits a neutron beam to a local irradiation location on a surface (la) of an inspection target (), a detection device () that detects, at each of inspection positions facing the surface (la), scattered neutrons returned from the inspection target () as a result of emission of the neutron beam to the irradiation location, and measures the detected number of the scattered neutrons at each of the detection positions, and a ratio calculation unit () that calculates, for each of the detection positions, a ratio of the detected number at the detection position to a reference value for the detection position, and outputs the ratios. The reference value is set as the detected number at each of the detection positions in an assumed case of no defects existing in the inspection target ().