The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2025
Filed:
Aug. 16, 2021
Event Capture Systems, Inc., Mint Hill, NC (US);
Brian James Mock, Mint Hill, NC (US);
John Graves Larkin, Gastonia, NC (US);
Akhil Kumar, Bangalore, IN;
David Hirvonen, Brooklyn, NY (US);
Chris Giroux, British Columbia, CA;
Event Capture Systems, Inc., Mint Hill, NC (US);
Abstract
A computer implemented method is disclosed herein for monitoring and determining a quality level of incoming raw material from one or more sources. The method includes (1) receiving visual data associated with the incoming raw material; (2) determining an indication of quality level associated with the incoming raw material; and (3) transmitting, to at least one of a graphical user interface (GUI) and a computer log, the indication of quality level and at least one timestamp associated with the visual data. The visual data may include a plurality of images received from one or more cameras configured for monitoring the incoming raw material. A related system is also disclosed herein.