The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 25, 2025

Filed:

Jun. 05, 2023
Applicants:

Inventec (Pudong) Technology Corporation, Shanghai, CN;

Inventec Corporation, Taipei, TW;

Inventors:

Hsin Hua Chen, Taipei, TW;

Chun-Ming Lu, Taipei, TW;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 7/02 (2006.01);
U.S. Cl.
CPC ...
G01M 7/027 (2013.01);
Abstract

A test fixture configured to support a DUT (device under test) and including a bottom base, two mounting bases, a rotatable base and a supporting base. The two mounting bases stand on a side of the bottom base and are spaced apart from each other. The rotatable base is rotatably disposed on the two mounting bases. At least a part of the rotatable base is located between the two mounting bases. The supporting base is fixed on a side of the rotatable base and configured to support the DUT. When the supporting base is parallel to the bottom base, the supporting base is located on a side of the rotatable base located farthest away from the bottom base.


Find Patent Forward Citations

Chen, Hsin. (2025). Test fixture for supporting a device under test (U.S. Patent No. 12259302). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12259302

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…