The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 25, 2025

Filed:

Sep. 20, 2021
Applicant:

Raytheon Company, Arlington, VA (US);

Inventors:

Eric Rogala, Tucson, AZ (US);

Gerald P. Uyeno, Tucson, AZ (US);

Assignee:

Raytheon Company, Arlington, VA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 4/04 (2006.01); G02B 26/08 (2006.01); G02B 27/28 (2006.01);
U.S. Cl.
CPC ...
G01J 4/04 (2013.01); G02B 26/0833 (2013.01); G02B 27/286 (2013.01);
Abstract

An image polarimeter includes a MEMS MMA divided into two or more segments in which the mirrors in each segment are provided with a polarizer of a given polarization. The mirrors in each segment are tipped and tilted to steer polarized light onto different portions of an optical detector. In certain configurations the mirrors may also be pistoned to reduce aberrations. Each frame that is read out from the detector includes two or more distinct component polarized images having different polarizations P0, P2, . . . of the same scene to fully characterize the polarization properties of the scene. Since the mirrors only tip/tilt/piston in the dead period between frames, no components are moving during image acquisition and co-registration of the component polarized images is simple. The number of segments and the different polarizations may be selected to implement Jones calculus, Mueller calculus and Stokes parameters or other polarimetry techniques.


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