The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2025
Filed:
Mar. 22, 2021
Isra Vision Gmbh, Darmstadt, DE;
Stefan Leute, Herten, DE;
Koichi Harada, Kanagawa, JP;
ISRA VISION GMBH, Darmstadt, DE;
Abstract
Methods for optically inspecting a surface () of an object () and an inspection device () including are described. With the method a temporally periodic pattern () with different illumination patterns () is generated on the surface () via a illumination device () of the inspection device () during an image recording sequence (), and in the image recording sequence a number of images of the pattern () on the surface () are recorded via an image recording device () of the inspection device (), wherein generating one of the different illumination patterns () is synchronised, respectively, with the image recording of one of the images of the pattern (), the phase of the pattern () is determined from the succession of the recorded known illumination patterns () in at least one image point and defects () on the surface () are detected from deviations of the recorded illumination pattern () from the generated known illumination pattern ().