The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2025
Filed:
Mar. 27, 2019
Applicant:
Nissan Motor Co., Ltd., Yokohama, JP;
Inventor:
Yasuhiro Tanaka, Kanagawa, JP;
Assignee:
Nissan Motor Co., Ltd., Yokohama, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B25J 19/06 (2006.01); B25J 9/16 (2006.01); G01L 5/00 (2006.01); G05B 23/02 (2006.01);
U.S. Cl.
CPC ...
B25J 19/06 (2013.01); B25J 9/1633 (2013.01); G01L 5/0061 (2013.01); G05B 23/0232 (2013.01);
Abstract
An abnormality detection device detects an abnormality of a device based on time-series data acquired from a device having a movable part. The abnormality determination device determines whether time-series data at a specific time have increased or decreased with respect to time-series data from a certain time prior to the specific time as the specific time is shifted, indicates an increase or decrease of the time-series data by defined numerical values, and detects an abnormality of the device based on integrated values obtained by integrating the defined numerical values.