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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12257644 B1

PDFFull Text
Date of Patent:
Mar. 25, 2025

Filed:

Aug. 29, 2022

Methods and systems for characterizing laser machining properties by measuring keyhole dynamics using interferometry

Applicant:

Ipg Photonics Corporation, Oxford, MA (US);

Inventor:

Paul J. L. Webster, Kingston, CA;

Assignee:

IPG Photonics Corporation, Oxford, MA (US);

Attorney:

Grossman Tucker Perreault & Pfleger, PLLC

Primary Examiner:

Uzma Alam

Assistant Examiner:

Jonathan Cook

Int. Cl.
CPC ...
B23K 26/03 (2006.01); B23K 9/00 (2006.01); B23K 10/02 (2006.01); B23K 15/00 (2006.01); B23K 26/06 (2014.01); B23K 26/082 (2014.01); B23K 26/14 (2014.01); B23K 26/244 (2014.01); B23K 31/12 (2006.01); G01B 5/00 (2006.01); G01B 9/0209 (2022.01); G01B 11/22 (2006.01); G01B 11/24 (2006.01); G01N 21/954 (2006.01); G01S 7/481 (2006.01); G01S 17/89 (2020.01); B26F 1/26 (2006.01); B26F 3/00 (2006.01);
U.S. Cl.
CPC ...
B23K 26/032 (2013.01); B23K 9/00 (2013.01); B23K 10/02 (2013.01); B23K 15/0046 (2013.01); B23K 26/0643 (2013.01); B23K 26/0648 (2013.01); B23K 26/082 (2015.10); B23K 26/14 (2013.01); B23K 26/244 (2015.10); B23K 31/125 (2013.01); G01B 5/0037 (2013.01); G01B 9/0209 (2013.01); G01B 11/22 (2013.01); G01B 11/2441 (2013.01); G01N 21/954 (2013.01); G01S 7/4817 (2013.01); G01S 17/89 (2013.01); B26F 1/26 (2013.01); B26F 3/004 (2013.01);
Abstract

A method, apparatus, and system are provided to monitor and characterize the dynamics of a phase change region (PCR) created during laser welding, specifically keyhole welding, and other material modification processes, using low-coherence interferometry. By directing a measurement beam to multiple locations within and overlapping with the PCR, the system, apparatus, and method are used to determine, in real time, spatial and temporal characteristics of the weld such as keyhole depth, length, width, shape and whether the keyhole is unstable, closes or collapses. This information is important in determining the quality and material properties of a completed finished weld. It can also be used with feedback to modify the material modification process in real time.

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