The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2025
Filed:
Jun. 15, 2021
Applicant:
Arcam Ab, Mölnlycke, SE;
Inventors:
Tomas Lock, Laholm, SE;
Björn Löfving, Kärna, SE;
Assignee:
Arcam AB, Mölnlycke, SE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B22F 10/31 (2021.01); B22F 10/80 (2021.01); B22F 12/41 (2021.01); B23K 15/00 (2006.01); B33Y 30/00 (2015.01); B33Y 50/00 (2015.01); G01J 5/00 (2022.01); G01J 5/20 (2006.01); G01N 25/02 (2006.01); G01N 25/04 (2006.01); G01N 25/72 (2006.01);
U.S. Cl.
CPC ...
B22F 10/31 (2021.01); B22F 10/80 (2021.01); B22F 12/41 (2021.01); B23K 15/0013 (2013.01); B23K 15/0026 (2013.01); B23K 15/0086 (2013.01); B33Y 30/00 (2014.12); B33Y 50/00 (2014.12); G01J 5/0003 (2013.01); G01J 5/20 (2013.01); G01N 25/02 (2013.01); G01N 25/04 (2013.01); G01N 25/72 (2013.01); G01J 2005/202 (2013.01);
Abstract
Devices, systems, and methods for calibrating for an electron beam additive manufacturing system. The electron beam manufacturing system includes electron beam guns. A calibration system includes an optical pyrometer. The optical pyrometer captures thermal radiation emitted from raw material. An analysis component is communicatively coupled to the optical pyrometer. The analysis component is programmed to determine calibration parameters from information from the optical pyrometer and a phase transition temperature.