The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2025
Filed:
Nov. 17, 2017
Shimadzu Corporation, Kyoto, JP;
National Institute of Advanced Industrial Science and Technology, Tokyo, JP;
Tsukasa Takeuchi, Kyoto, JP;
Toshiya Okazaki, Ibaraki, JP;
Yoko Iizumi, Ibaraki, JP;
Hiromichi Kataura, Ibaraki, JP;
Masako Yudasaka, Ibaraki, JP;
SHIMADZU CORPORATION, Kyoto, JP;
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY, Tokyo, JP;
Abstract
An object is to provide a method of inspection enabling a slurry of a batch resulting in abnormal accumulation to be identified in advance, and to provide an SWCNT slurry for bioimaging that has undergone the inspection. In order to solve the above problems, the present invention provides a method for inspecting a semiconductor single-walled carbon nanotube (SWCNT) slurry for bioimaging, the slurry comprising: semiconductor SWCNTs oxidized by being directly irradiated with ultraviolet rays in atmosphere and a dispersant composed of an amphiphilic substance that coats surfaces of the SWCNTs, the method comprising: using at least two types of methods selected from the group consisting of absorption spectroscopy, a photoluminescence method, and particle size measurement, confirming that an average particle size of the semiconductor SWCNTs is smaller than 10 nm, isolated dispersibility of the semiconductor SWCNTs is high, and/or the semiconductor SWCNTs are oxidized.