The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2025
Filed:
Jul. 18, 2022
Ormco Corporation, Brea, CA (US);
Mithil J. Shah, North Hills, CA (US);
Yevgeniy Sirovskiy, Castro Valley, CA (US);
Wayne R. Murphy, Brea, CA (US);
Gopal Biswas, Maharashtra, IN;
Ormco Corporation, Brea, CA (US);
Abstract
A computer-implemented method for marking an object on an aligner. The aligner surface is modeled. The method includes calculating a normal for each tile in a tessellated surface and disqualifying a tile from being selected. For tiles not disqualified, a patch is identified that produces a markable area. The method includes selecting an object to be marked, calculating a location of the object in the markable area, and providing the location of the object to a marking device. Disqualifying includes comparing an angle between a normal and an orientation of the beam to an origin of the calculated normal on each tile. Disqualifying includes disqualifying the at least one tile when the angle is outside of a range of −90° to +90°. Identifying the patch includes separating the patch into at least two smaller patches, and one of the two smaller patches of tiles is the markable area.