The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2025
Filed:
Nov. 08, 2022
Applicant:
Washington University, St. Louis, MO (US);
Inventors:
Tiezhi Zhang, St. Louis, MO (US);
Qinghao Chen, St. Louis, MO (US);
Shuang Zhou, St. Louis, MO (US);
Yuewen Tan, St. Louis, MO (US);
Assignee:
Washington University, St. Louis, MO (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/02 (2006.01); A61B 6/00 (2006.01); A61B 6/03 (2006.01); A61B 6/40 (2024.01); A61B 6/42 (2024.01);
U.S. Cl.
CPC ...
A61B 6/032 (2013.01); A61B 6/027 (2013.01); A61B 6/4021 (2013.01); A61B 6/4028 (2013.01); A61B 6/4085 (2013.01); A61B 6/4233 (2013.01); A61B 6/4435 (2013.01);
Abstract
A CT scanning method compensates gantry motion blurring in projection measurement based on synchronized focal spot movement and detector data shifting. Tube power is increased by moving the focal on the target and reducing focal spot dwell duration. The CT scanning method is used on helical CT and cone beam with a rotating anode source and CBCT and TBCT with a linear array x-ray source.