The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2025
Filed:
May. 31, 2019
Applicant:
Nikon Corporation, Tokyo, JP;
Inventors:
Mariko Hirokawa, Yokohama, JP;
Yasushi Tanabe, Fujisawa, JP;
Assignee:
NIKON CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/12 (2006.01); A61B 3/00 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
A61B 3/12 (2013.01); A61B 3/0025 (2013.01); A61B 3/0058 (2013.01); G06T 7/0012 (2013.01); G06T 2207/10101 (2013.01); G06T 2207/20212 (2013.01); G06T 2207/30041 (2013.01); G06T 2207/30101 (2013.01);
Abstract
An image processing method includes acquiring a first direction fundus image imaged in a state in which an examined eye is directed in a first direction, and a second direction fundus image imaged in a state in which the examined eye is directed in a second direction different to the first direction, generating a combined image for analyzing a fundus-peripheral portion of the examined eye by combining the first direction fundus image and the second direction fundus image, and outputting the combined image.