The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 2025
Filed:
Nov. 08, 2022
Canon Kabushiki Kaisha, Tokyo, JP;
Kenichirou Haruta, Chiba, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
An inspection system extracts feature points from a scan image and from a reference image, performs alignment of the scan image and the reference image based on the extracted feature points, inspects a printed material using the aligned scan and reference images, and performs processing in accordance with a method selected from among a plurality of methods including at least a first method and a second method in a case where the number of the feature points in the reference image is less than a predetermined number. The processing is performed such that, in the case where the number of the feature points in the reference image is less than the predetermined number, the alignment using at least the extracted feature points is performed when the first method is selected, and the inspection is then carried out, whereas the inspection is not carried out when the second method is selected.