The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 18, 2025

Filed:

Mar. 24, 2023
Applicant:

Star Technologies (Wuhan) Co., Ltd., Wuhan, CN;

Inventor:

Choon Leong Lou, Singapore, SG;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); H01L 21/66 (2006.01);
U.S. Cl.
CPC ...
H01L 22/32 (2013.01); G01R 31/2887 (2013.01); H01L 22/12 (2013.01); H01L 22/14 (2013.01); H01L 22/34 (2013.01);
Abstract

An alignment method and an alignment device thereof are provided. The alignment method includes: providing a wafer including wafer coordinate information. Two probes are respectively aligned with two bonding pads on a dicing road of the wafer, and an image capture device is used to assist the two probes to obtain actual wafer information. The wafer coordinate information is then compared with the actual wafer information to determine whether the two probes are accurately aligned with the two bonding pads on the dicing road, respectively. When an alignment position of the two probes is determined, the positions of any chips and bonding pads on the wafer can be determined.


Find Patent Forward Citations

Lou, Choon. (2025). Alignment method and alignment device (U.S. Patent No. 12255113). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12255113

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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