The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 2025
Filed:
Jul. 02, 2020
Applicant:
Integrated Dna Technologies, Inc., Coralville, IA (US);
Inventors:
Heng Li, Wellesley, MA (US);
Gavin Kurgan, Iowa City, IA (US);
Matthew McNeill, Iowa City, IA (US);
Yu Wang, North Grafton, MA (US);
Assignee:
INTEGRATED DNA TECHNOLOGIES, INC., Coralville, IA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G16B 20/30 (2019.01); G16B 20/20 (2019.01); G16B 30/10 (2019.01); G16B 40/20 (2019.01);
U.S. Cl.
CPC ...
G16B 20/30 (2019.02); G16B 20/20 (2019.02); G16B 30/10 (2019.02); G16B 40/20 (2019.02);
Abstract
Described herein is a system and process for identifying and characterizing double-stranded DNA break repair sites that are based on biological information and have improved accuracy. Also described is a sequence alignment process that uses biological data to inform the alignment matrix for position specific alignment scoring, resulting in the identification of noncanonical target sites.