The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 2025
Filed:
Sep. 06, 2022
Nec Laboratories America, Inc., Princeton, NJ (US);
Yi-Hsuan Tsai, Santa Clara, CA (US);
Bingbing Zhuang, San Jose, CA (US);
Samuel Schulter, New York, NY (US);
Buyu Liu, Cupertino, CA (US);
Sparsh Garg, San Jose, CA (US);
Ramin Moslemi, Pleasanton, CA (US);
Inkyu Shin, Daejeon, KR;
NEC Corporation, Tokyo, JP;
Abstract
Systems and methods are provided for multi-modal test-time adaptation. The method includes inputting a digital image into a pre-trained Camera Intra-modal Pseudo-label Generator, and inputting a point cloud set into a pre-trained Lidar Intra-modal Pseudo-label Generator. The method further includes applying a fast 2-dimension (2D) model, and a slow 2D model, to the inputted digital image to apply pseudo-labels, and applying a fast 3-dimension (3D) model, and a slow 3D model, to the inputted point cloud set to apply pseudo-labels. The method further includes fusing pseudo-label predictions from the fast models and the slow models through an Inter-modal Pseudo-label Refinement module to obtain robust pseudo labels, and measuring a prediction consistency for the pseudo-labels. The method further includes selecting confident pseudo-labels from the robust pseudo labels and measured prediction consistencies to form a final cross-modal pseudo-label set as a self-training signal, and updating batch parameters utilizing the self-training signal.