The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 18, 2025

Filed:

Dec. 09, 2022
Applicant:

Leica Microsystems Cms Gmbh, Wetzlar, DE;

Inventors:

Jose Miguel Serra Lleti, Wetzlar, DE;

Tobias Hessler, Wetzlar, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/13 (2017.01); G02B 21/24 (2006.01);
U.S. Cl.
CPC ...
G06T 7/13 (2017.01); G02B 21/244 (2013.01); G06T 2207/10056 (2013.01);
Abstract

A method of automatically determining boundaries of a z-stack of images of an object, the z-stack of the images acquired by imaging the object at different focal positions, is provided. The method includes generating a set of images of the object, each image being captured at a different focal position, and applying a blurriness-W metric function to each image. The blurriness-W metric function is a blurriness or sharpness metric function having a focal position as a variable, and shows a global extremum for maximal or minimal sharpness at the focal position and secondary extrema adjoining the global extremum. The method includes calculating, by the blurriness-W metric function, a metric value for each image, and based on the blurriness-W metric function showing a primary extremum and two of the secondary extrema adjoining the primary extremum, determining the z-stack boundaries in dependence of the focal positions assigned to the two secondary extrema.


Find Patent Forward Citations

Serra Lleti, Jose. (2025). Method for determining boundaries of a z-stack of images of an object, corresponding optical instrument and computer program therefor (U.S. Patent No. 12254639). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12254639

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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