The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 2025
Filed:
Sep. 26, 2024
Shenzhen Saiwai Technology Co., Ltd., Guangdong, CN;
Ming Huang, Guangdong, CN;
Shenzhen Saiwai Technology Co., Ltd., Shenzhen, CN;
Abstract
Disclosed are method and device for automatically pre-detecting paper cup design defects. The method includes: receiving an imported design drawing to be detected, and obtaining a corresponding fan-shaped image mask through the trained image segmentation model; converting the fan-shaped image mask into a real fan-shaped frame; calculating and obtaining a corresponding target model design drawing according to the real fan-shaped frame, and mapping to the specification data of a corresponding model; and partitioning the real fan-shaped frame according to the mapped specification data, detecting corresponding defects in each partition through a preset detection module, and outputting defect detection results. The present disclosure enables identification of design defects solely through graphic design drafts, thereby reducing costs, enhancing flexible production capabilities, and filling a gap in the paper cup industry. Defect detection functions are pluggable, that is, ineffective detection modules can be replaced, and new detection items can be added.