The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 2025
Filed:
Aug. 20, 2020
Peking University, Beijing, CN;
Peking University, Beijing, CN;
Abstract
A direct structured illumination microscopy (dSIM) reconstruction method is provided. First, a time domain modulation signal is extracted through a wavelet. Then, an incoherent signal is converted into a coherent signal. Next, an accumulation amount at each pixel is calculated. Finally, a super-resolution image is generated by using a correlation between signals at different spatial positions. An autocorrelation algorithm of dSIM is insensitive to an error of a reconstruction parameter. dSIM bypasses a complex frequency domain operation in structured illumination microscopy (SIM) image reconstruction, and prevents an artifact caused by the parameter error in the frequency domain operation. The dSIM algorithm has high adaptability and can be used in laboratory SIM, nonlinear SIM imaging systems, or commercial systems.