The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 2025
Filed:
Nov. 15, 2022
International Business Machines Corporation, Armonk, NY (US);
Tushar Agrawal, West Fargo, ND (US);
Martin G. Keen, Cary, NC (US);
Sarbajit K. Rakshit, Kolkata, IN;
Jeremy R. Fox, Georgetown, TX (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
According to one embodiment, a method, computer system, and computer program product for identifying induced deformation of a 3D object is provided. The embodiment may include receiving an unaltered three-dimensional (3D) rendering of an object and attribute information of the object. The embodiment may include identifying one or more influencing factors of forecasted local deformation of one or more portions of the 3D rendering based on the attribute information. The embodiment may include creating, via a generative adversarial network (GAN), a 3D rendering of the object showing the forecasted local deformation. The embodiment may include identifying induced deformation of one or more other portions of the 3D rendering caused by the forecasted local deformation. The embodiment may include creating, via the GAN, a 3D rendering of the object showing the identified induced deformation.