The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 2025
Filed:
Dec. 15, 2020
Applicant:
Schlumberger Technology Corporation, Sugar Land, TX (US);
Inventors:
Richa Sharma, Cambridge, MA (US);
Quincy K. Elias, Hyde Park, MA (US);
Assignee:
SCHLUMBERGER TECHNOLOGY CORPORATION, Sugar Land, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/24 (2006.01); G06N 3/08 (2023.01); G06T 5/00 (2024.01); G06T 7/60 (2017.01); G06V 10/22 (2022.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01); G01N 33/24 (2013.01); G06T 7/60 (2013.01); G06V 10/22 (2022.01); G06T 2207/30181 (2013.01);
Abstract
A method of producing an image of at least one rock cutting. The method can include forming or obtaining a substrate having a patterned top surface. The method can also include using the patterned top surface of the substrate to support at least one rock cutting, controlling an image acquisition system to acquire at least one image of the rock cutting for storage and subsequent image processing.
Sharma, Richa. (2025). Patterned substrate for use in image-based classification of rock cuttings (U.S. Patent No. 12254408). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12254408
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile