The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 18, 2025

Filed:

Mar. 30, 2021
Applicant:

Accenture Global Solutions Limited, Dublin, IE;

Inventors:

Shoban Babu Balasubramani, Bangalore, IN;

Tuhin Kanti Mondal, Kolkata, IN;

Atanu Mondal, Paschim Bardhaman, IN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G01N 21/95 (2006.01); G06N 3/04 (2023.01); G06N 3/08 (2023.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G01N 21/95 (2013.01); G06N 3/04 (2013.01); G06N 3/08 (2013.01); G06T 7/0006 (2013.01);
Abstract

Aspects of the present disclosure provide systems, methods, and computer-readable storage media that support detection and mitigation of defects occurring in outputs of a process. A modelling engine creates and trains models to identify defects occurring in outputs of a process or system. A set of causation rules may be created and trained to identify causes of different defects identifiable via the models and a set of control rules may be created and trained to generate control data that may mitigate the causes of identified defects. A process monitoring device incorporating the trained models and rules may then be used to monitor the process and detect defects using the models. Once a defect is detected, the rules may be applied to determine the cause of the defect and then control data may be generated to modify the process such that further occurrences of the defect are reduced or eliminated.


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