The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 2025
Filed:
Jun. 29, 2022
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventor:
Kazuo Wakai, Tokyo, JP;
Assignee:
CANON KABUSHIKI KAISHA, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/12 (2006.01); G06K 15/00 (2006.01);
U.S. Cl.
CPC ...
G06K 15/408 (2013.01);
Abstract
The inspection device determines whether or not it is possible to inspect whether or not the imaged image of the surface to be inspected has a defect based on the comparison between the imaged image imaged of the surface to be inspected of the printed matter and the reference image. Whether or not to execute the processing related to printing is controlled according to the determination result of whether or not the inspection device can execute the inspection.