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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12254254 B1

PDFFull Text
Date of Patent:
Mar. 18, 2025

Filed:

Dec. 01, 2021

Circuits and techniques for predicting failure of circuits based on stress origination metrics and stress victim events

Applicant:

Infineon Technologies Ag, Neubiberg, DE;

Inventors:

Veit Kleeberger, Munich, DE;

Rafael Zalman, Markt Schwaben, DE;

Georg Georgakos, Erding, DE;

Dirk Hammerschmidt, Villach, AT;

Bernhard Gstoettenbauer, Engerwitzdorf, AT;

Ludwig Rossmeier, Dorfen, DE;

Thomas Zettler, Hoehenkirchen-Siegertsbrunn, DE;

Assignee:

Infineon Technologies AG, Neubiberg, DE;

Attorney:

Shumaker & Sieffert, P.A.

Primary Examiner:

Phallaka Kik

Int. Cl.
CPC ...
G06F 30/3308 (2020.01); G01R 31/26 (2020.01); G01R 31/27 (2006.01); G06F 11/00 (2006.01); G06F 30/33 (2020.01); G06F 30/333 (2020.01); G06F 30/367 (2020.01); G06F 119/02 (2020.01); G06F 119/18 (2020.01);
U.S. Cl.
CPC ...
G06F 30/3308 (2020.01); G01R 31/2642 (2013.01); G01R 31/27 (2013.01); G06F 11/008 (2013.01); G06F 30/33 (2020.01); G06F 30/333 (2020.01); G06F 30/367 (2020.01); G06F 2119/02 (2020.01); G06F 2119/18 (2020.01);
Abstract

In some examples, a method of operating a circuit is described. The method may include performing a circuit function and estimating a probability of failure of the circuit based on one or more stress origination metrics, one or more stress victim events, and one or more initial state conditions.

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Kleeberger, Veit. (2025). Circuits and techniques for predicting failure of circuits based on stress origination metrics and stress victim events (U.S. Patent No. 12254254). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12254254

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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