The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 18, 2025

Filed:

Aug. 23, 2019
Applicant:

Nippon Telegraph and Telephone Corporation, Tokyo, JP;

Inventors:

Tomohiro Nakatani, Musashino, JP;

Marc Delcroix, Musashino, JP;

Keisuke Kinoshita, Musashino, JP;

Nobutaka Ito, Musashino, JP;

Shoko Araki, Musashino, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/27 (2020.01); G06N 3/08 (2023.01); G10L 21/0216 (2013.01);
U.S. Cl.
CPC ...
G06F 30/27 (2020.01); G06N 3/08 (2013.01); G10L 21/0216 (2013.01);
Abstract

A mask estimation apparatus includes processing circuitry configured to estimate, for a target segment to be processed among a plurality of segments of a continuous time, a first mask which is an occupancy ratio of a target signal to an observation signal of the target segment, based on a first feature obtained from a plurality of the observation signals of the target segment recorded at a plurality of locations, and estimate a parameter for modeling a second feature and a second mask which is an occupancy ratio of the target signal to the observation signal based on an estimation result of the first mask in the target segment and the second feature obtained from the plurality of the observation signals of the target segment.


Find Patent Forward Citations

Loading…