The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 2025
Filed:
Oct. 25, 2019
Applicant:
Nec Corporation, Tokyo, JP;
Inventors:
Jun Nishioka, Tokyo, JP;
Yoshiaki Sakae, Tokyo, JP;
Kazuhiko Isoyama, Tokyo, JP;
Yuji Kobayashi, Tokyo, JP;
Assignee:
NEC CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/00 (2013.01); G06F 21/57 (2013.01);
U.S. Cl.
CPC ...
G06F 21/577 (2013.01); G06F 2221/033 (2013.01);
Abstract
In order to provide an evaluation apparatus that appropriately evaluates risk of a source code changing over time, an evaluation apparatus includes a generating unit and an output unit. The generating unit generates an evaluation related to risk of a first library described in a source code. The output unit calculates the degree of risk of the fist library, based on at least the generated evaluation, calculates a risk value indicating risk inherent in the source code, based on the calculated degree of risk, and also outputs time-series data of the calculated risk value.