The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 2025
Filed:
Jul. 09, 2021
Canon Kabushiki Kaisha, Tokyo, JP;
Yuki Samejima, Tokyo, JP;
Akihiko Kawamura, Tokyo, JP;
CANON KABUSHIKI KAISHA, Tokyo, JP;
Abstract
There is provided an information processing device determining necessity/non-necessity of adjustment of conditions for inspecting molding defects of a molded composition on a substrate the information processing device including: an image acquiring unit configured to acquire an image of the molded composition; an inspection unit configured to perform inspection of the molding defects from the image using a machine learning model; an information acquiring unit configured to acquire information relating to a molding defect of the composition on a reference substrate; and a determination unit configured to compare an inspection result acquired by inspecting the molding defects on the reference substrate using the inspection unit with the information relating to a molding defect of the composition that is acquired by the information acquiring unit and determine necessity/non-necessity of the adjustment of the conditions of the inspection based on a result of the comparison.