The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 2025
Filed:
Dec. 12, 2019
Applicants:
Karlsruher Institut Fur Technologie, Karlsruhe, DE;
Vanguard Photonics Gmbh, Eggenstein-Leopoldshafen, DE;
Inventors:
Matthias Lauermann, Karlsruhe, DE;
Christian Koos, Siegelsbach, DE;
Philipp-Immanuel Dietrich, Wörth, DE;
Assignees:
Karlsruher Institut fur Technologie, Karlsruhe, DE;
Vanguard Photonics GmbH, Eggenstein-Leopoldshafen, DE;
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/20 (2006.01); B29C 64/264 (2017.01); G02B 21/16 (2006.01); G02B 21/33 (2006.01); G03F 7/00 (2006.01);
U.S. Cl.
CPC ...
G03F 7/2041 (2013.01); B29C 64/264 (2017.08); G02B 21/16 (2013.01); G02B 21/33 (2013.01); G03F 7/70341 (2013.01); G03F 7/70416 (2013.01);
Abstract
The invention relates to an apparatus () and a method for optically characterizing or processing an object (), and to an object transport unit (). The apparatus () comprises The apparatus (), the method and the object transport unit () facilitate the optical characterization or processing of an object () in a manner that meets the specific needs of high-throughput industrial applications.