The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 18, 2025

Filed:

Nov. 26, 2021
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Vivek Venugopal, Santa Clara, CA (US);

Jacky G. Ko, Sunnyvale, CA (US);

Ueyn L. Block, Menlo Park, CA (US);

James R. Wilson, Saratoga, CA (US);

Christopher D. Jones, Los Gatos, CA (US);

Assignee:

APPLE INC., Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 6/42 (2006.01); G02B 6/08 (2006.01); H01L 31/0232 (2014.01);
U.S. Cl.
CPC ...
G02B 6/4249 (2013.01); G02B 6/08 (2013.01); G02B 6/4202 (2013.01); H01L 31/0232 (2013.01);
Abstract

An electronic device can include a housing defining an aperture, and an electromagnetic radiation emitter and an electromagnetic radiation detector disposed in the housing. An optical component can be disposed in the aperture and can include a first region of a first material having a first index of refraction, the first region aligned with the electromagnetic radiation emitter, a second region of the first material, the second region aligned with the electromagnetic radiation detector, and a bulk region surrounding a periphery of the first region and a periphery of the second region, the bulk region including a second material having a second index of refraction that is lower than the first index of refraction.


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