The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 18, 2025

Filed:

Oct. 12, 2021
Applicant:

Leica Microsystems Cms Gmbh, Wetzlar, DE;

Inventors:

Oliver Keul, Nauborn, DE;

Volker Schacht, Marburg, DE;

Kai Ritschel, Heuchelheim, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/36 (2006.01); G02B 21/00 (2006.01); G02B 21/24 (2006.01); H04N 23/71 (2023.01); H04N 23/75 (2023.01);
U.S. Cl.
CPC ...
G02B 21/365 (2013.01); G02B 21/0032 (2013.01); G02B 21/006 (2013.01); G02B 21/008 (2013.01); G02B 21/242 (2013.01); H04N 23/71 (2023.01); H04N 23/75 (2023.01);
Abstract

A control device for a microscope includes an operating device, an actuator and a processor. The operating device is configured to be operated by a user to vary focusing and/or positioning of an optical imaging system of the microscope relative to a sample. The actuator is configured to adjust an aperture of a detection pinhole which is included in the microscope so as to eliminate out-of-focus light from detection light which is directed by the optical imaging system onto a detector of the microscope. The processor is configured to detect a predetermined operating condition in response to a user operation of the operating device and to control the actuator to vary the aperture of the detection pinhole upon detection of the predetermined operating condition.


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