The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 18, 2025

Filed:

Oct. 10, 2023
Applicant:

Renesas Electronics Corporation, Tokyo, JP;

Inventors:

Masahide Matsumoto, Tokyo, JP;

Kazunori Ochiai, Tokyo, JP;

Tomoyoshi Ujii, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/317 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31705 (2013.01); G01R 31/31718 (2013.01); G01R 31/31727 (2013.01);
Abstract

According to one embodiment, a semiconductor device includes a first chip and a second chip arranged on a substrate, the first chip outputs first time stamp data and first trace data in which a time stamp value is associated with a first execution result obtained by executing software, the second chip outputs second trace data in which a difference value with a marker is associated with a second execution result obtained by executing the software, the second execution result obtained by the second chip executing the software is associated with a third time stamp value calculated based on a second time stamp value and the difference value in a debugger.


Find Patent Forward Citations

Matsumoto, Masahide. (2025). Semiconductor device, debug system, and debug method (U.S. Patent No. 12253561). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12253561

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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