The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 18, 2025

Filed:

May. 03, 2024
Applicant:

Ut-battelle, Llc, Oak Ridge, TN (US);

Inventors:

Maxim A Ziatdinov, Oak Ridge, TN (US);

Kevin Roccapriore, Oak Ridge, TN (US);

Yongtao Liu, Oak Ridge, TN (US);

Kyle P. Kelley, Oak Ridge, TN (US);

Rama K. Vasudevan, Oak Ridge, TN (US);

Jacob D Hinkle, Oak Ridge, TN (US);

Sergei V. Kalinin, Knoxville, TN (US);

Assignee:

UT-BATTELLE, LLC, Oak Ridge, TN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 60/10 (2010.01); G02B 21/10 (2006.01);
U.S. Cl.
CPC ...
G01Q 60/10 (2013.01); G02B 21/10 (2013.01);
Abstract

Systems are provided for machine learning-driven operation of instrumentation with human in the loop. The systems use a model with learnt model parameters to define points for physical-characteristic measurements once the model is trained. The systems use active learning, which considers selection, reinforcement and/or adjustment inputs from the instrumentation's user, to enable describing a relationship between local features of sample-surface structure shown in image patches and determined representations of physical-characteristic measurements.


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