The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 2025
Filed:
Sep. 09, 2020
Fukuda Co., Ltd., Tokyo, JP;
FUKUDA CO., LTD., Tokyo, JP;
Abstract
The present invention provides a method for leak testing by which occurrence of fine leakage from a work as a test object can be determined without being affected by a released tracer gas that is also released from a non-defective work. The method for leak testing includes a series of steps including a gas bombing step wherein a work W as a test object is soaked in a pressurized tracer gas, a work setting step wherein the work subjected to the gas bombing is set in a hermetically sealed container, a vacuum suctioning step wherein the hermetically sealed containeris vacuum suctioned by a suction deviceand a measuring step wherein tracer gas measurement data are obtained by measuring a vacuum suctioned tracer gas with a detector. Tracer gas measurement data for a non-defective work are preliminarily obtained by performing the series of steps for the non-defective work having same specifications as the work W as the test object. The tracer gas measurement data for the work W as the test object are compared with the tracer gas measurement data for the non-defective work in the measuring step, and thereby, occurrence of fine leakage from the work as the test object is determined.