The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 18, 2025

Filed:

Oct. 19, 2021
Applicant:

Visia Imaging S.r.l., San Giovanni Valdarno, IT;

Inventors:

Alessandro Foggi, San Giovanni Valdarno, IT;

Luca Del Tongo, Arezzo, IT;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01M 11/04 (2006.01);
U.S. Cl.
CPC ...
G01M 11/04 (2013.01);
Abstract

A machine for measuring the optical properties of a lens for a pair of eyeglasses includes a light emitting system for emitting a light beam; a receiver arranged for receiving the light beam; an alignment system configured to align the lens according to a predetermined measuring position; a gripping system configured to grip the eyeglasses; and a supporting system on which the eyeglasses or the single lens are positioned. The alignment system is arranged at a distance from the light emitting system so that at least a lower support element is not intercepted by the light beam. The gripping system is in a closed configuration after the alignment has been performed and then a subsequent shifting of the support structure is carried out to bring the lens under the light emitting system.


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