The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 2025
Filed:
Dec. 21, 2022
Meta Platforms Technologies, Llc, Menlo Park, CA (US);
Yiyang Wu, Rochester, NY (US);
Hsien-Hui Cheng, Woodinville, WA (US);
Xuan Wang, Kirkland, WA (US);
Lu Lu, Kirkland, WA (US);
META PLATFORMS TECHNOLOGIES, LLC, Menlo Park, CA (US);
Abstract
A system for measuring a satellite ghost efficiency of a diffractive lens is provided. The system includes a light source configured to output a first probing beam, and a beam tweaking assembly disposed between the light source and the diffractive lens, and configured to convert the first probing beam into a second probing beam that is a non-collimated beam. The diffractive lens diffracts the second probing beam into a plurality of diffracted beams including a first diffracted beam of a parent diffraction order and a second diffracted beam of a satellite ghost diffraction order. The beam tweaking assembly includes one or more optical lenses, and an adjustable optical power. The system also includes a detector configured to generate a beam spot pattern including a first beam spot corresponding to the first diffracted beam and a second beam spot corresponding to the second diffracted beam.