The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 2025
Filed:
Jul. 26, 2022
Tianjin University, Tianjin, CN;
Tianjin University, Tianjin, CN;
Abstract
A method for in situ measurement of temperature at microwave-induced microscopic hot spots, temperature measuring particles and the device used are provided. For the temperature measurement demand of the microscopic hot spot of microwave field, loading fluorescent temperature measuring particles on the surface of solid particles, and the actual temperature of particles in micro scale can be measured by using its temperature sensitive fluorescence characteristics. The present disclosure builds a microwave field in-situ fluorescence test device to disperse the test particles loaded with fluorescent temperature measuring materials in the liquid solvent and place in the quartz sample tank in the microwave cavity, which can measure the actual temperature of the particles to be measured under microwave radiation. The present disclosure breaks through the difficult problem of measuring micro scale temperature in microwave field and can realize the quantitative measurement of microwave-induced overheating temperature in micro scale.