The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 18, 2025

Filed:

Mar. 09, 2024
Applicant:

Qubit Moving and Storage, Llc, Franconia, NH (US);

Inventors:

Gary Vacon, East Falmouth, MA (US);

Kristin A. Rauschenbach, Franconia, NH (US);

Assignee:

Qubit Moving and Storage, LLC, Franconia, NH (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02001 (2022.01);
U.S. Cl.
CPC ...
G01B 9/02007 (2013.01); G01B 2290/55 (2013.01);
Abstract

An optical source is configured to simultaneously generate a set of four time-correlated photons comprising a first pair of photons and a second pair of photons. An interferometer is configured to receive a photon from the first pair of photons and configured to receive another photon from the first pair of photons. A first and a second detector configured to generate an electrical signal in response to measurements of an output of the interferometer. A third detector is configured to generate an electrical signal in response to measurement of a photon from the second pair of photons. A fourth detector is configured to generate an electrical signal in response to measurement of another photon from the second pair of photons. A processor is configured to determine a coincidence of the generated electrical signals in response to measurements of the second pair of photons, thereby identifying the set of four time-correlated photons and heralding an interferometric measurement from the generated electrical signals of the first and second detectors.


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