The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 18, 2025

Filed:

Dec. 28, 2021
Applicant:

Schneider Electric Systems Usa, Inc., Foxborough, MA (US);

Inventors:

Bartosz Boguslawski, Grenoble, FR;

Loryne Bissuel-Beauvais, Montréal, CA;

Matthieu Boujonnier, Boston, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
F04B 49/06 (2006.01); E21B 47/008 (2012.01); F04B 47/00 (2006.01); F04B 49/10 (2006.01);
U.S. Cl.
CPC ...
F04B 49/065 (2013.01); E21B 47/008 (2020.05); F04B 47/00 (2013.01); F04B 49/103 (2013.01); F04B 2203/0209 (2013.01); F04B 2207/70 (2013.01);
Abstract

Systems/methods for real-time monitoring and control of a well site provide an event monitor and detector for progressing cavity pump (PCP) operations at the well site. The event monitor and detector uses machine learning (ML) based anomaly detection to detect operations that fall outside normal PCP operating space. The event monitor and detector then computes novelty scores for the anomalies and checks whether the novelty scores exceed a threshold novelty score. If the number of novelties detected within a given detection window exceeds a minimum threshold count, then the event monitor and detector flags an 'event' and automatically responds accordingly. The event monitor and detector also provides an explanation with the alerts that quantifies the extent to which various PCP parameters contributed to the event. The event monitor and detector further performs drift detection to determine whether an event may be due to operator-initiated adjustments to PCP parameters.


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