The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 18, 2025

Filed:

Jan. 16, 2020
Applicant:

Hewlett-packard Development Company, L.p., Spring, TX (US);

Inventors:

Serigo Gonzalez Martin, Sant Cugat del Valles, ES;

Manuel Freire Garcia, Sant Cugat del Valles, ES;

Ismael Fernandez Aymerich, Sant Cugat del Valles, ES;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B29C 64/393 (2017.01); B33Y 10/00 (2015.01); B33Y 30/00 (2015.01); B33Y 50/02 (2015.01);
U.S. Cl.
CPC ...
B29C 64/393 (2017.08); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12); B33Y 50/02 (2014.12);
Abstract

In an example, a method includes obtaining a compensation model characterising a relationship between a location of an object within a fabrication chamber of an additive manufacturing apparatus and a geometrical compensation to be applied to a model of said object, wherein different geometrical compensation values are associated with different locations. In some examples the method further includes determining a magnitude of a dimension parameter of each object of a set of objects to be generated in a build operation. The method may include determining a spatial arrangement of objects to be generated within the build volume, based on the magnitude of the dimension parameters and the geometrical compensation values for an intended location of object generation in the spatial arrangement.


Find Patent Forward Citations

Loading…