The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 2025
Filed:
Oct. 29, 2021
Concept Laser Gmbh, Lichtenfels, DE;
Frank Herzog, Lichtenfels, DE;
Florian Bechmann, Lichtenfels, DE;
Tobias Bokkes, Untersiemau, DE;
Fabian Zeulner, Lichtenfels, DE;
Concept Laser GmbH, Lichtenfels, DE;
Abstract
A process monitoring system for an additive manufacturing apparatus includes a scanner, a sensor device, and an optical focus-tracking device. The scanner includes an optical adjustment device that directs a melting beam emitted by a laser melting device onto a construction plane to generate a melting section of the construction plane. The sensor device may detect reflected radiation from the melting section and generate sensor data indicative of a size, shape, and/or temperature corresponding to the melting section. The optical focus-tracking device includes a focusing lens located between the scanner and the sensor device. The focusing lens may be actuatable by electronic machine data derived from the sensor data to impart a first focus adjustment with respect to the reflected radiation detected by the sensor followed by a second focus adjustment with respect to the melting beam directed by the optical adjustment device.