The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 2025
Filed:
Aug. 25, 2020
Hitachi, Ltd., Tokyo, JP;
HITACHI, LTD., Tokyo, JP;
Abstract
An object of the present invention is to increase sensitivity and position resolution of measurement of an arrival position of a charged particle beam irradiated during treatment. A beam monitoring system includes: a gamma ray detector that detects gamma rays generated by interaction between a charged particle beam and an irradiation target; a shield that is disposed between the gamma ray detector and an irradiation axis of the beam and has a plurality of slits; and a calculation unit that analyzes a detection result of the gamma ray detector and reconfigures a count distribution of the detected gamma rays into a distribution of the beam irradiation axis based on a geometric arrangement of the shield, the detector, and the irradiation axis of the beam. The calculation unit obtains the arrival position of the particle beam from the reconfigured distribution.