The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 18, 2025

Filed:

Jun. 21, 2021
Applicant:

Auris Health, Inc., Santa Clara, CA (US);

Inventors:

Chauncey F. Graetzel, Palo Alto, CA (US);

Russell W. Pong, Newark, CA (US);

Sarah Plewe, Redwood City, CA (US);

Toni Divic, Stanford, CA (US);

Aadel Al-Jadda, San Carlos, CA (US);

Assignee:

Auris Health, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 34/00 (2016.01); A61B 34/20 (2016.01); A61B 34/30 (2016.01); A61B 90/00 (2016.01); A61B 17/00 (2006.01);
U.S. Cl.
CPC ...
A61B 34/30 (2016.02); A61B 34/20 (2016.02); A61B 34/25 (2016.02); A61B 34/70 (2016.02); A61B 90/37 (2016.02); A61B 90/39 (2016.02); A61B 2017/00725 (2013.01); A61B 2034/2051 (2016.02); A61B 2034/2055 (2016.02); A61B 2034/301 (2016.02); A61B 2090/0807 (2016.02); A61B 2090/3937 (2016.02); A61B 2090/3983 (2016.02);
Abstract

Methods, systems, and devices for calibrating a medical instrument are discussed herein. For example, a first instrument can be configured to access an anatomical site via a first access path and a second instrument can be configured to access the anatomical site via a second access path. The second instrument can include an imaging component configured to provide image data representative of the anatomical site and the first instrument. A difference can be identified between a first coordinate frame associated with the first instrument and a second coordinate frame associated with the second instrument. A control frame of reference associated with the first instrument can be updated based at least in part on the difference.


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