The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 11, 2025

Filed:

Feb. 08, 2022
Applicant:

Lg Electronics Inc., Seoul, KR;

Inventors:

Yonghak Suh, Seoul, KR;

Woochan Kim, Seoul, KR;

Assignee:

LG ELECTRONICS INC., Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/10 (2009.01); H04B 7/06 (2006.01); H04B 17/336 (2015.01); H04W 16/28 (2009.01);
U.S. Cl.
CPC ...
H04W 16/28 (2013.01); H04B 7/0617 (2013.01); H04B 17/336 (2015.01); H04W 24/10 (2013.01);
Abstract

The present disclosure may provide a method for operating a UE in a wireless communication system. Herein, the method may include: transmitting, by a first UE, information necessary for beam pattern determination to a base station; receiving, from a base station, candidate beam pattern information determined based on the information necessary for beam pattern determination; receiving, from the base station, beam pattern information that the base station determined based on a measurement result for candidate beams, which are sequentially transmitted according to the candidate beam pattern information; and performing uplink transmission based on the determined beam pattern information, wherein the measurement result may include residual self-interference (SI) information measured for each of the candidate beams, which the first UE transmits, and cross link interference (CLI) information that a second UE measures for the each of the candidate beams transmitted from the first UE.


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