The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 11, 2025
Filed:
Oct. 26, 2022
Teledyne Flir Commercial Systems, Inc., Goleta, CA (US);
Randy J Hansen, Goleta, CA (US);
Naseem Y. Aziz, Goleta, CA (US);
Teledyne FLIR Commercial Systems, Inc., Goleta, CA (US);
Abstract
Techniques for facilitating unit cell selection verification systems and methods are provided. In one example, a method includes detecting, by each detector of a focal plane array (FPA), electromagnetic radiation. Each detector is selectively coupled to a readout circuit of the FPA via a selection circuit of the FPA. The method further includes, during a frame period, applying a predetermined signal pattern to a portion of the selection circuit, where the portion is associated with a subset of detectors of the FPA, and performing a readout of the FPA to obtain a respective output signal associated with each respective detector of the FPA. The method further includes determining whether the portion of the selection circuit is operating properly based at least on the output signal associated with the detectors of the subset from the readout. Related systems and devices are also provided.