The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 11, 2025

Filed:

Apr. 24, 2019
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventor:

Shinichi Yamaguchi, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0004 (2013.01); H01J 49/0036 (2013.01);
Abstract

An imaging mass spectrometer includes an analysis executing section that executes MSanalysis for a target component on each of a plurality of micro regions set within a two-dimensional measurement region on a sample to collect data; an ion selecting section that selects a plurality of kinds of product ions derived from, or assumed to be derived from, the target component based on at least a part of the data collected by the analysis executing section; and a distribution image creating section that determines, using signal strength of each of the kinds of product ions in each micro region within the measurement region. a small region in which all of the kinds of product ions are detected or a small region assumed to have high reliability that all of the kinds of product ions are derived from the target component, and creates a distribution image visualizing the small region.


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