The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 11, 2025
Filed:
Mar. 17, 2023
10x Genomics, Inc., Pleasanton, CA (US);
Augusto Manuel Tentori, Dublin, CA (US);
Hanyoup Kim, Foster City, CA (US);
Siyuan Xing, Newark, CA (US);
Felice Alessio Bava, Pleasanton, CA (US);
Rajiv Bharadwaj, Pleasanton, CA (US);
Cedric Uytingco, Pleasanton, CA (US);
Erica Graziosa, Pleasanton, CA (US);
10x Genomics, Inc., Pleasanton, CA (US);
Abstract
A method for aligning a sample to an array is provided. An image of sample image of a sample can be received by a data processor. The sample image having a first resolution. An array image including an overlay of an array with the sample and an array fiducial can be received by the data processor. The array image having a second resolution lower than the first resolution of the sample image. The sample image can be registered to the array image by aligning the sample image and the array image. An aligned image can be generated based on the registering. The aligned image can include an overlay of the sample image with the array. The aligned image can be provided by the data processor. A method for detecting fiducials associated with an array is provided. Systems and non-transitory computer readable mediums performing the method are also provided.