The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 11, 2025
Filed:
Nov. 11, 2021
Qualcomm Incorporated, San Diego, CA (US);
Yizhe Zhang, San Diego, CA (US);
Fatih Murat Porikli, San Diego, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
Techniques are provided for determining consistency measures for image segmentation. For instance, a system can determine a first segmentation feature associated with a first segmentation mask of a first image frame. The system can determine a second segmentation feature associated with a second segmentation mask of a second image frame. The second segmentation feature corresponds to the first segmentation feature. The system can determine a first image feature of the first image frame that corresponds to the first segmentation feature and a second image feature of the second image frame that corresponds to the second segmentation feature. The system can determine a first similarity measurement between the first image feature and the second image feature. The system can further determine a temporal consistency measurement associated with the first image frame and the second image frame based at least in part on the first similarity measurement.