The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 11, 2025
Filed:
Jan. 11, 2022
Teledyne Flir Commercial Systems, Inc., Goleta, CA (US);
Stephanie Lin, Buellton, CA (US);
Dylan M. Rodriguez, Goleta, CA (US);
Joseph Kostrzewa, Santa Ynez, CA (US);
Teledyne FLIR Commercial Systems, Inc., Goleta, CA (US);
Abstract
Techniques for facilitating non-uniformity mitigation for imaging systems and methods are provided. In one example, a method includes cropping an image based on a defect in the image to obtain a cropped image. The method further includes cropping a supplemental flat field correction (SFFC) map based on the defect in the image to obtain a cropped SFFC map. The method further includes determining a scaling value of a scaling term based at least on a cost function. The method further includes scaling the SFFC map based on the scaling value to obtain a scaled SFFC map. Related devices and systems are also provided.